EP1K10TC100-1N vs EP1K30TC144-1N Comparison
Detailed side-by-side comparison of EP1K10TC100-1N by Intel and EP1K30TC144-1N by Altera. Compare key specifications, electrical parameters, packaging, lifecycle status, pricing, and availability to determine the best component for your design requirements.
Specification Comparison
| Parameter | EP1K10TC100-1N | EP1K30TC144-1N |
|---|---|---|
| Brand | Intel | Altera |
| Category | FPGA & CPLD | FPGA & CPLD |
| Lifecycle Status | Obsolete | Obsolete |
| Stock Status | In Stock | In Stock |
| Unit Price (USD) | $9.20 | $11.50 |
| Family | ACEX-1K | β |
| Series | EP1K10 | ACEX-1K |
| Logic Elements / Cells | 576 | β |
| Total Gates (typical) | 10,000 | β |
| Embedded RAM Bits | 12,288 bits | β |
| Logic Array Blocks (LABs) | 72 | β |
| Embedded Array Blocks (EABs) | 3 x 4 Kbit | β |
| User I/Os | 66 | β |
| Core Supply Voltage | 2.5 V (2.375 V to 2.625 V) | β |
| Operating Temperature | 0 Β°C to 70 Β°C (commercial) | [DATA_NEEDED: operating temperature range] |
| Process Technology | 0.22 Β΅m CMOS SRAM | 0.18 Β΅m SRAM |
| Package | 100-pin TQFP (14 mm x 14 mm, 1 mm height) | β |
| Mounting Type | Surface Mount (gull-wing) | Surface Mount |
| Speed Grade | -1N (commercial, slower tier) | β |
| Configuration Method | SRAM (external PROM required) | β |
| JTAG Support | Yes (IEEE 1149.1 boundary-scan) | β |
| RoHS Status | Compliant | [DATA_NEEDED: RoHS compliance status] |
| Number of Logic Elements (LEs) | β | 1,728 |
| Typical Gates | β | 30,000 |
| Number of Logic Array Blocks (LABs) | β | 216 |
| Embedded Memory (EAB) | β | 24,576 bits (6 EABs) |
| Number of User I/O | β | 102 |
| Number of I/O Banks | β | 4 |
| Package Type | β | 144-LQFP (TQFP) |
| Core Voltage | β | 2.5 V |
| I/O Voltage | β | 3.3 V (LVCMOS/LVTTL); 2.5 V tolerant |
| Configuration | β | SRAM-based, JTAG (IEEE 1149.1) + serial/parallel passive |
| PLLs | β | 6 (per device family) |
| Lead-Free | β | [DATA_NEEDED: lead-free status] |
| MSL Level | β | [DATA_NEEDED: MSL moisture sensitivity level] |