EP1K30QC208-1N vs EP1K30QC208-1 Comparison
Detailed side-by-side comparison of EP1K30QC208-1N by Altera and EP1K30QC208-1 by Intel. Compare key specifications, electrical parameters, packaging, lifecycle status, pricing, and availability to determine the best component for your design requirements.
Specification Comparison
| Parameter | EP1K30QC208-1N | EP1K30QC208-1 |
|---|---|---|
| Brand | Altera | Intel |
| Category | FPGA & CPLD | FPGA & CPLD |
| Lifecycle Status | Obsolete | Obsolete |
| Stock Status | In Stock | In Stock |
| Unit Price (USD) | $29.88 | $10.85 |
| Device Family | ACEX 1K | ACEX-1K |
| Product Type | FPGA (Field Programmable Gate Array) | β |
| Number of Typical Gates | 30000 | β |
| Number of Logic Elements / Cells | 1728 | β |
| Number of LABs / CLBs | 216 | β |
| Total RAM Bits | 24576 | β |
| Number of User I/O | 147 | β |
| Supply Voltage | 2.5 V | β |
| Process Technology | 0.22 um | 2.5 V CMOS |
| Maximum Internal Frequency | 250 MHz | β |
| Package Type | 208-BFQFP (208-pin PQFP) | β |
| Package Code | FQFP, square | β |
| Terminal Form | Gull wing | β |
| Number of Terminals | 208 | β |
| Temperature Grade | Commercial | β |
| Lead-Free Finish (N-Suffix) | Yes | β |
| Mounting Type | Surface Mount | Surface Mount (gull-wing leads) |
| RoHS Status | [DATA_NEEDED: RoHS compliance status] | Compliant (lead-free) |
| REACH Status | [DATA_NEEDED: REACH compliance status] | β |
| Operating Temperature Range | [DATA_NEEDED: exact operating temperature range] | β |
| Moisture Sensitivity Level | [DATA_NEEDED: MSL] | β |
| Logic Elements (LEs) | β | 1,728 |
| Equivalent Gates | β | 30,000 |
| Logic Array Blocks (LABs) | β | 216 |
| Embedded Memory (EAB) | β | 24,576 bits |
| Maximum User I/O | β | 147 |
| Core Supply Voltage (VCCINT) | β | 2.5 V (2.375 V to 2.625 V) |
| Package | β | 208-BFQFP (Plastic Quad Flat Pack, PQFP208) |
| Terminal Pitch | β | 0.500 mm |
| Operating Temperature | β | 0 Β°C to +70 Β°C (commercial) |
| Maximum Operating Frequency | β | up to 250 MHz (family typical) |
| Configuration Method | β | SRAM, in-system reconfigurable (volatile) |
| Boundary-Scan Test | β | JTAG IEEE 1149.1 |
| I/O Voltage Support | β | 2.5 V / 3.3 V (multi-volt I/O) |
| Configuration Device Support | β | EPC2, EPC4, EPC8 Enhanced Configuration Devices |