EPF8820AQC208-3N vs EPF8820AQC208-2 Comparison
Detailed side-by-side comparison of EPF8820AQC208-3N by Altera and EPF8820AQC208-2 by Altera. Compare key specifications, electrical parameters, packaging, lifecycle status, pricing, and availability to determine the best component for your design requirements.
Altera
EPF8820AQC208-2 - FLEX 8000 FPGA, 8K Gates, 152 I/O, 5V, PQFP-208 | Altera
EPF8820AQC208-2 ObsoleteSpecification Comparison
| Parameter | EPF8820AQC208-3N | EPF8820AQC208-2 |
|---|---|---|
| Brand | Altera | Altera |
| Category | FPGA & CPLD | FPGA & CPLD |
| Lifecycle Status | Obsolete | Obsolete |
| Stock Status | In Stock | In Stock |
| Unit Price (USD) | $11.40 | $22.80 |
| Device Family | FLEX 8000 | β |
| Product Type | FPGA (Field-Programmable Gate Array) / Loadable PLD | β |
| Usable Gates | 8,000 (up to 16,000 family maximum) | 8,000 |
| Logic Cells (LEs) | 672 | β |
| User I/Os | 152 | 152 |
| Logic Elements / Registers | 1,500 | β |
| Process Technology | 0.42 Β΅m CMOS SRAM | CMOS, SRAM-based configuration |
| Supply Voltage | 5 V | 5 V |
| Operating Temperature | 0 Β°C to 70 Β°C (Commercial) | 0 C to 70 C (Commercial) |
| Package Type | FQFP-208 (PQFP-208, gull-wing) | 208-BFQFP / 208-Pin PQFP (FQFP) |
| Package Code | FQFP | FQFP, gull-wing terminals |
| Terminal Form | Gull Wing | β |
| Terminal Count | 208 | β |
| Speed Grade | -3 (16-bit loadable counter 95 MHz; 16-to-1 MUX 7.9 ns) | β |
| Configuration Memory | CMOS SRAM (volatile, in-circuit reconfigurable) | β |
| Configuration Devices Supported | EPC1, EPC1213, EPC1064, EPC1441 | β |
| Mounting Type | Surface Mount | Surface Mount |
| RoHS Status | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: rohs status not specified in provided data] |
| Manufacturer | β | Altera (Intel PSG) |
| Family | β | FLEX 8000 |
| Device Type | β | FPGA - Field Programmable Gate Array |
| Logic Cells / Registers | β | 672 |
| Logic Array Blocks (LABs) | β | 84 (8 LEs per LAB) |
| Maximum Operating Frequency | β | 125 MHz |
| Logic Family | β | CMOS |
| Configuration Method | β | In-Circuit Reconfigurability (ICR) via external device; SRAM-volatile |
| JTAG / Boundary Scan | β | IEEE 1149.1 compliant |
| Grade | β | Commercial |