EPM3512AQC208-15N vs EPM3512AQC208-10N Comparison
Detailed side-by-side comparison of EPM3512AQC208-15N by Altera and EPM3512AQC208-10N by Intel. Compare key specifications, electrical parameters, packaging, lifecycle status, pricing, and availability to determine the best component for your design requirements.
Altera
EPM3512AQC208-15N - 512-Macro CPLD MAX 3000A PQFP-208 | Altera
EPM3512AQC208-15N β Last Time BuySpecification Comparison
| Parameter | EPM3512AQC208-15N | EPM3512AQC208-10N |
|---|---|---|
| Brand | Altera | Intel |
| Category | FPGA & CPLD | FPGA & CPLD |
| Lifecycle Status | Last_time_buy | Obsolete |
| Stock Status | In Stock | In Stock |
| Unit Price (USD) | $20.50 | $42.80 |
| Family | MAX 3000A | MAX 3000A |
| Device Type | CPLD - Complex Programmable Logic Device | CPLD (Complex Programmable Logic Device) |
| Macro Cells | 512 | β |
| Logic Array Blocks (LABs) | 16 | 16 |
| Maximum User I/O Pins | 172 | β |
| Typical Usable Gates | 12,000 | β |
| Number of Logic Elements | 512 | β |
| Pin-to-Pin Delay (tPD) | 15 ns | β |
| Operating Supply Voltage (VCCINT) | 3.3 V | β |
| I/O Supply Voltage (VCCIO) | 2.5 V / 3.3 V (MultiVolt) | β |
| Programmable I/O Standards | LVTTL, LVCMOS, PCI (with external resistor) | β |
| In-System Programmability | Yes (IEEE Std. 1532 compliant) | β |
| Configuration Memory | EEPROM (non-volatile) | β |
| JTAG Support | Yes (BST/Boundary-Scan Test) | β |
| Package | PQFP-208 (QC208) | 208-pin PQFP (Plastic Quad Flat Pack) |
| Mounting Type | Surface Mount | β |
| Operating Temperature | 0C to +70C (commercial) | 0 C to 70 C (commercial) |
| RoHS Status | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS status not in verified web data] |
| Macrocells | β | 512 |
| Usable Gates | β | Up to 10,000 |
| User I/Os | β | 172 |
| Supply Voltage | β | 3.3 V |
| Pin-to-Pin Delay | β | 4.5 ns (-10 speed grade) |
| Maximum Internal Frequency | β | 227.3 MHz |
| Speed Grade | β | -10 |
| Process Technology | β | CMOS EEPROM |
| In-System Programming | β | IEEE Std. 1149.1 JTAG, IEEE Std. 1532 |
| Boundary-Scan Test (BST) | β | Built-in, IEEE 1149.1 compliant |
| I/O Standards | β | MultiVolt (1.8V / 2.5V / 3.3V) |