EPF8282ATI100-3NGZ vs EPF8282ATC100-3 Comparison
Detailed side-by-side comparison of EPF8282ATI100-3NGZ by Altera and EPF8282ATC100-3 by Intel. Compare key specifications, electrical parameters, packaging, lifecycle status, pricing, and availability to determine the best component for your design requirements.
Altera
EPF8282ATI100-3NGZ
EPF8282ATI100-3NGZ - FLEX 8000 FPGA 78 I/O 100-TQFP | Altera
EPF8282ATI100-3NGZ ObsoleteIntel
EPF8282ATC100-3
EPF8282ATC100-3 - FLEX 8000 FPGA 2.5K Gates 78 I/O TQFP-100 | Intel
EPF8282ATC100-3 ObsoleteSpecification Comparison
| Parameter | EPF8282ATI100-3NGZ | EPF8282ATC100-3 |
|---|---|---|
| Brand | Altera | Intel |
| Category | FPGA & CPLD | FPGA & CPLD |
| Lifecycle Status | Obsolete | Obsolete |
| Stock Status | In Stock | In Stock |
| Unit Price (USD) | $24.95 | $10.25 |
| Family | FLEX 8000 | FLEX 8000 |
| Logic Elements / Cells | 208 | β |
| Logic Array Blocks (LABs) | 26 | β |
| Usable Gates | ~2,500 | 2,500 |
| User I/Os | 78 | β |
| Process Technology | 0.42 Β΅m CMOS | 0.42 micron CMOS SRAM |
| Configuration Memory | SRAM (volatile, requires external load) | β |
| Core Supply Voltage | 5 V | β |
| Maximum Toggle Frequency | 125 MHz | β |
| Package | 100-pin TQFP | 100-pin TQFP (100-TQFP) |
| Mounting Type | Surface Mount | β |
| Operating Temperature | -40 Β°C to +85 Β°C (Industrial) | β |
| JTAG Boundary Scan | Yes (IEEE 1149.1) | β |
| RoHS Status | [DATA_NEEDED: RoHS status] | β |
| Lead-Free / Pb-Free | [DATA_NEEDED: lead-free status] | β |
| Speed Grade | -3 | -3 |
| Logic Cells (LEs) | β | 208 |
| Typical Gates Equivalent | β | 12,000 |
| Maximum User I/O | β | 78 |
| Number of Logic Array Blocks (LABs) | β | 26 |
| Embedded Array Blocks (EABs) | β | 6 |
| Total RAM Bits | β | 12 Kbits |
| Supply Voltage (Core) | β | 5 V |
| MultiVolt I/O Support | β | 3.3 V / 5 V |
| Maximum Frequency | β | 125 MHz |
| Configuration Method | β | SRAM, EPC1/EPC1064/EPC1213/EPC1441, microprocessor |
| Operating Temperature (Commercial) | β | 0 C to +70 C |
| In-Circuit Reconfigurable | β | Yes (ICR) |
| Boundary Scan | β | JTAG IEEE 1149.1 |