EP20K200EBC356-2 vs EP20K200EBC356-1 Comparison
Detailed side-by-side comparison of EP20K200EBC356-2 by Altera and EP20K200EBC356-1 by Altera. Compare key specifications, electrical parameters, packaging, lifecycle status, pricing, and availability to determine the best component for your design requirements.
Specification Comparison
| Parameter | EP20K200EBC356-2 | EP20K200EBC356-1 |
|---|---|---|
| Brand | Altera | Altera |
| Category | FPGA & CPLD | FPGA & CPLD |
| Lifecycle Status | Obsolete | Obsolete |
| Stock Status | In Stock | In Stock |
| Unit Price (USD) | $99.50 | $142.00 |
| Series | APEX 20KE | β |
| Family | APEX 20K (APEX 20KE enhancement) | APEX 20K (APEX 20KE) |
| Typical Gates | 200,000 | β |
| Maximum Logic Elements | 8320 | β |
| Macros / Logic Cells | 832 | β |
| Maximum Flip-Flops | 13,824 | β |
| Embedded RAM | 53,248 bits | β |
| User I/Os | 271 | β |
| Number of Terminals / Pins | 356 (LBGA) | β |
| Propagation Delay | 2.5 ns | 2.5 ns |
| Supply Voltage | 2.5 V (core) | β |
| Operating Temperature | 0 C to 85 C (commercial) | 0 Β°C to 85 Β°C (Commercial) |
| Logic Family | CMOS | β |
| Number of PLLs | 4 embedded PLLs | β |
| Number of DDR Interfaces | 4 | β |
| Package Type | 356-LBGA (EBC suffix) | β |
| Mounting Type | Surface Mount (BGA) | Surface Mount (BGA) |
| Speed Grade | -2 | β |
| Compliance | RoHS status [DATA_NEEDED: RoHS] | β |
| System Gates | β | 200,000 |
| Logic Elements / Cells | β | 8,320 |
| Maximum User I/Os | β | 277 |
| Core Voltage | β | 1.8 V (1.71 V to 1.89 V) |
| Process Technology | β | 0.22 Β΅m CMOS |
| Internal Performance | β | Up to 367 MHz |
| Package | β | 356-ball LBGA (35 x 35 mm) |
| Architecture | β | MultiCore (LUT + product-term + embedded memory) |
| On-chip Memory | β | Embedded System Blocks (ESB / SRAM) |
| Configuration Method | β | JTAG (ByteBlaster / MasterBlaster), passive serial |
| Development Software | β | Altera Quartus II |
| RoHS Status | β | [DATA_NEEDED: RoHS status not stated in verified sources] |
| Lifecycle Status | β | Obsolete / EOL |