EPF6016AFC100-3 vs EPF6010ATC100-3N Comparison
Detailed side-by-side comparison of EPF6016AFC100-3 by Intel and EPF6010ATC100-3N by Intel. Compare key specifications, electrical parameters, packaging, lifecycle status, pricing, and availability to determine the best component for your design requirements.
Intel
EPF6010ATC100-3N - FLEX 6000 FPGA, 880 Cells, 100-TQFP | Intel
EPF6010ATC100-3N β Last Time BuySpecification Comparison
| Parameter | EPF6016AFC100-3 | EPF6010ATC100-3N |
|---|---|---|
| Brand | Intel | Intel |
| Category | FPGA & CPLD | FPGA & CPLD |
| Lifecycle Status | Obsolete | Last_time_buy |
| Stock Status | In Stock | In Stock |
| Unit Price (USD) | $18.23 | $9.95 |
| Family | FLEX 6000 | FLEX 6000 |
| Device Type | FPGA (Field Programmable Gate Array) | β |
| Logic Gates | 16,000 gates | β |
| Logic Cells | 1,320 cells | β |
| Maximum Internal Frequency | 142.86 MHz | 142.86 MHz |
| Process Technology | 0.42 um CMOS | 0.42 Β΅m CMOS |
| User I/O | 81 | β |
| Supply Voltage | 3.3 V | β |
| Package | 100-pin FineLine BGA (FBGA) | 100-pin TQFP (14 x 14 x 1.4 mm) |
| Mounting Type | Surface Mount (BGA) | Surface Mount |
| Operating Temperature | 0 C to 85 C (Commercial) | 0 Β°C to +70 Β°C (commercial) |
| Architecture | SRAM-based, 4-input LUT | β |
| Configuration Method | SRAM (in-system programmable) | β |
| JTAG Support | IEEE 1149.1 Boundary Scan | β |
| RoHS Status | unknown | Compliant |
| Logic Elements / Cells | β | 880 |
| Equivalent Gate Count | β | 10,000 gates |
| Logic Array Blocks (LABs) | β | 88 |
| User I/Os | β | 71 |
| Supply Voltage (Operating) | β | 3.0 V to 3.6 V |
| Speed Grade | β | -3 |
| Programming Method | β | In-system SRAM via ByteBlaster/BitBlaster |
| MSL Level | β | 3 (168 hours) |